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- Keysight
- Oscilloscopes, Analyzers, Meters
- Keysight B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
Keysight B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
Category - Oscilloscopes, Analyzers, Meters
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On website of FAMAGA you can buy Keysight B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe, and many other spare parts from the
Keysight with delivery all over the United States, including: Dublin.For price list, delivery
timings and other product features of the Keysight, please, fill in the feedback form or send a description
of goods you need to our e-mail sales@famaga.us
Description
Key Features & SpecificationsMeasurement capabilities- Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 µ,V - 200 V
- AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities
- Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)
- Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
- EasyEXPERT group+ characterization environment is available either on mainframe with 15 inch touch screen (embedded Windows 10) or on user&rsquo,s PC
- Multiple measurement modes for quick setup and measurement execution (application test, classic test, tracer test, quick test and oscilloscope view)
- Graphical display, automated analysis capabilities and data generation to Excel and image for analysis and reporting
- EasyEXPERT group+ can be installed on as many PCs as you need without additional charge to take advantage of offline personal analyzer environment among users in your department.
- Configurable and upgradeable measurement modules up to 10 slots in a box
- 15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT group+
- Windows Embedded Standard 10 (WES10)
- GPIB, USB, LAN interfaces, and VGA video output port
Device Type | Application Tests |
CMOS Transistor | Id-Vg, Id-Vd, Vth, breakdown, capacitance, QSCV, etc. |
Bipolar Transistor | Ic-Vc, diode, Gummel plot, breakdown, hfe, capacitance, etc. |
Discrete device | Id-Vg, Id-Vd, Ic-Vc, diode, etc. |
Memory | Vth, capacitance, endurance test, etc. |
Power device | Pulsed Id-Vg, pulsed Id-Vd, breakdown, etc. |
Nano Device | Resistance, Id-Vg, Id-Vd, Ic-Vc, etc. |
Reliability test | NBTI/PBTI, charge pumping, electro migration, hot carrier injection, J-Ramp, TDDB, etc. |
And more | And more |
Measurement capabilities | Staircase sweep, multi-channel sweep, pulse sweep, IV sampling, high-speed IV sampling, CV, C-t, C-f, etc. |
Switching matrix control | B2200, B2201 and E5250 (E5252 card) are supported. |
Analysis and data display capabilities | List display, X-Y graph (with marker, cursor and line), automatic analysis function, user function, etc. |
Data management | User workspace management, save/recall measurement data and setting with auto-record feature |
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Manufacturer
Keysight