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- Keysight
- Oscilloscopes, Analyzers, Meters
- Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution
Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution
Category - Oscilloscopes, Analyzers, Meters
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On website of FAMAGA you can buy Keysight NX5730A High Throughput 1 ns Pulsed IV Memory Test Solution, and many other spare parts from the
Keysight with delivery all over the United States, including: Dublin.For price list, delivery
timings and other product features of the Keysight, please, fill in the feedback form or send a description
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Description
Key Features and Functions- Precise and fast characterization of new memory, such as spin transfer torque magnetoresistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers
- Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ
- Perform all typical MTJ characterization tests in one solution
- 10 to 100 times faster cycle test, such as a bit error rate test (BERT)
- Capture and visualize MTJ switching waveforms clearly during the writing pulse
- Dedicated solution with Keysight Technologies&rsquo, technical expertise
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Manufacturer
Keysight